Louisiana State University, Materials Characterization Center



AXIS 165 High Performance Multi-Technique Surface Analysis (XPS/Auger)


JEOL 2010 High-resolution Transmission Electron Mciroscope (HRTEM)


Rigaku MiniFlex X-ray Diffractometer


Wyko NT1000 Surface Profiler


Perkin Elmer/Differential Scanning Calorimeter (DSC 7)


Gatan Model 656 Dimpler Grinder


Gatan Model 691 Precision Ion Polishing System (PIPS)